Transient tunneling spectroscopy (TTS) study of electron tunneling from phosphorus atoms in silicon
✍ Scribed by A. Dargys; S. Zurauskas; N. Žurauskienė
- Publisher
- Springer
- Year
- 1991
- Tongue
- English
- Weight
- 596 KB
- Volume
- 52
- Category
- Article
- ISSN
- 1432-0630
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