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Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon

✍ Scribed by Pavel L. Komarov; Mihai G. Burzo; Gunhan Kaytaz; Peter E. Raad


Book ID
108360914
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
104 KB
Volume
34
Category
Article
ISSN
0026-2692

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