๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Transient temperature measurements and modeling of IGBT's under short circuit

โœ Scribed by Ammous, A.; Allard, B.; Morel, H.

Book ID
111962386
Publisher
IEEE
Year
1998
Tongue
English
Weight
323 KB
Volume
13
Category
Article
ISSN
0885-8993

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Trench IGBT failure mechanisms evolution
Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
โœ A. Benmansour; S. Azzopardi; J.C. Martin; E. Woirgard ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 567 KB

Two extreme configurations under short-circuit conditions leading to the punch through trench IGBT failure under the effect of the temperature and the gate resistance have been studied. By analyzing internal physical parameters, it was highlighted that the elevation of the temperature causes an acce