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Transient sputter yields, build-up of the altered layer and Ge-segregation as a function of the O2+ ion-fluence in SiGe

✍ Scribed by C. Huyghebaert; B. Brijs; T. Janssens; W. Vandervorst


Book ID
108417832
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
141 KB
Volume
203-204
Category
Article
ISSN
0169-4332

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