Transient Simulation to Analyze Flash Memory Erase Improvements Due to Germanium Content in the Substrate

✍ Scribed by Wolfson, S.C.; Ho, F.D.

• Book ID: 114620119
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 280 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2058770