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Transient relaxation of the normal state resistance of tin microstrips in the presence of current bias

✍ Scribed by Donald P. Butler; Thomas Y. Hsiang; Gerard A. Mourou

Publisher: Springer US
Year: 1985
Tongue: English
Weight: 475 KB
Volume: 61
Category: Article
ISSN: 0022-2291
DOI: 10.1007/bf00682731

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