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Transient enhanced diffusion of ion-implanted boron in Si during rapid thermal annealing: Masayasu Miyake and Shinji Aoyama, J appl Phys, 63, 1988, 1754–1757


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
149 KB
Volume
39
Category
Article
ISSN
0042-207X

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