✦ LIBER ✦
Transient effects in SIMS analysis of Si with Cs+ at high incidence angles: Secondary ion yield variations
✍ Scribed by P.A.W. van der Heide
- Book ID
- 114166054
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 257 KB
- Volume
- 194
- Category
- Article
- ISSN
- 0168-583X
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