Transient damage resulting in failure of a component exposed to ionizing radiation environment : R. P. S. Yadav and Krishan Lal. Microelectron. Reliab., 19, 223 (1979)

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 131 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90036-0