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Transgenic insect resistance traits increase corn yield and yield stability

✍ Scribed by Edgerton, Michael D; Fridgen, Jon; Anderson, John R; Ahlgrim, Jenne; Criswell, Monty; Dhungana, Prabhakar; Gocken, Tom; Li, Zheng; Mariappan, Sadayappan; Pilcher, Clinton D; Rosielle, Arnold; Stark, Steven B

Book ID: 111879625
Publisher: Nature Publishing Group
Year: 2012
Tongue: English
Weight: 418 KB
Volume: 30
Category: Article
ISSN: 1087-0156
DOI: 10.1038/nbt.2259

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