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Transformations and resynthesis for testability of RT-level control-data path specifications : Subhrajit Bhattacharya et al. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1(3), 304 (September 1993)


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
110 KB
Volume
34
Category
Article
ISSN
0026-2714

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