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Transfer-function approach to random microdensitometer positioning errors

โœ Scribed by Engeldrum, Peter G.


Book ID
115385401
Publisher
Optical Society of America
Year
1982
Weight
611 KB
Volume
72
Category
Article
ISSN
0030-3941

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A transfer-matrix approach to random res
โœ Derrida, B; Vannimenus, J ๐Ÿ“‚ Article ๐Ÿ“… 1982 ๐Ÿ› Institute of Physics ๐ŸŒ English โš– 395 KB

We introduce a transfer-matrix formulation to compute the conductance of random resistor networks. We apply this method to strips of width up to 40, and use finite size scaling arguments to obtain an estimate for the conductivity critical exponent in two dimensions, t = 1.28*0.03.