✦ LIBER ✦
Trading-off programming speed and current absorption in flash memories with the ramped-gate programming technique
✍ Scribed by Esseni, D.; Villa, C.; Tassan, S.; Ricco, B.
- Book ID
- 114538097
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 181 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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