✦ LIBER ✦
Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories
✍ Scribed by Pavel Poliakov; Pieter Blomme; Alessandro Vaglio Pret; Miguel Miranda Corbalan; Roel Gronheid; Diederik Verkest; Jan Van Houdt; Wim Dehaene
- Book ID
- 113800616
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 732 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
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