𝔖 Bobbio Scriptorium
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Traceability in measurement – time for an update?

✍ Scribed by H. Steffen Peiser; Paul De Bièvre

Publisher
Springer-Verlag
Year
1999
Tongue
English
Weight
42 KB
Volume
4
Category
Article
ISSN
0949-1775

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Thick silicon detectors are becoming widely used with reliable detectors available. They are often considered as a part of coincidence setup, where the timing resolution is of a crucial importance. Since over-biasing of thick detectors is sometimes unpractical, the timing resolution can be compromis