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Trace Element Analysis of Rough Diamond by LA-ICP-MS: A Case of Source Discrimination?

✍ Scribed by Claude Dalpé; Pierre Hudon; David J. Ballantyne; Darrell Williams; Denis Marcotte

Book ID: 109281838
Publisher: John Wiley and Sons
Year: 2010
Tongue: English
Weight: 480 KB
Volume: 55
Category: Article
ISSN: 0022-1198
DOI: 10.1111/j.1556-4029.2010.01509.x

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