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Trace Element Analysis of NIST SRM 614 and 616 Glass Reference Materials by Laser Ablation Microprobe-Inductively Coupled Plasma-Mass Spectrometry

✍ Scribed by Masanori Kurosawa; Simon E. Jackson; Shigeho Sueno

Book ID: 111417836
Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 361 KB
Volume: 26
Category: Article
ISSN: 1639-4488
DOI: 10.1111/j.1751-908x.2002.tb00625.x

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