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Trace Analysis of Selected High-Purity Metals Using High-Resolution Inductively Coupled Plasma Mass Spectrometry and Inductively Coupled Plasma Optical Emission Spectrometry

✍ Scribed by Matschat, R. ;Czerwensky, M.

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 239 KB
Volume: 160
Category: Article
ISSN: 0031-8965
DOI: 10.1002/1521-396x(199704)160:2<567::aid-pssa567>3.0.co;2-8

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