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Trace analysis in cadmium telluride by heavy ion induced x-ray emission and by SIMS

✍ Scribed by C. Scharager; R. Stuck; P. Siffert; J. Cailleret; Ch. Heitz; G. Lagarde; D. Tenorio

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Trace element analysis by ion induced X-

✍ B. Raith; M. Roth; K. Göllner; B. Gonsior; H. Ostermann; C.D. Uhlhorn 📂 Article 📅 1977 🏛 Elsevier Science ⚖ 369 KB

Trace element analysis in liquids by pro

✍ G. Deconninck 📂 Article 📅 1977 🏛 Elsevier Science ⚖ 620 KB

Metal-ion distribution in metalloprotein

✍ C.H. Lochmüller; J. Galbraith; R.L. Walter; R.E. Willis 📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 244 KB

Comparison of sensitivities in trace ele

✍ J. Scheer; L. Voet; U. Wätjen; W. Koenig; F.W. Richter; U. Steiner 📂 Article 📅 1977 🏛 Elsevier Science ⚖ 408 KB

Trace element analysis of seawater and f

✍ M.E. Alexander; E.K. Biegert; J.K. Jones; R.S. Thurston; V. Valkovic; R.M. Wheel 📂 Article 📅 1974 🏛 Elsevier Science ⚖ 268 KB

Heavy-ion-induced mutations in the gpt d

✍ Ken-ichi Masumura; Kensuke Kuniya; Toshihiro Kurobe; Masamichi Fukuoka; Fumio Ya 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 151 KB