Trace analysis. First edition: Edited by John H. Yoe, Professor of chemistry and Director, John Lee Pratt, Trace Analysis Laboratory, University of Virginia; and Henry J. Koch, Jr., Sloan-Kettering Institute for Cancer Research, New York, N. Y. John Wiley and Sons, Inc., New York, N. Y., 1957. xiv + 672 pp. Price $12.00

✍ Scribed by Michael Cefola

• Book ID: 118842143
• Publisher: Elsevier Science
• Year: 1958
• Tongue: English
• Weight: 143 KB
• Volume: 78
• Category: Article
• ISSN: 0003-9861
• DOI: 10.1016/0003-9861(58)90339-4