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Trace Analysis || Chemical State Analysis of Metal and Oxide Surface Layers Using Auger Parameters from X-Ray Photoelectron Spectroscopy

✍ Scribed by R. H. West and J. C. Vickerman

Book ID: 123660782
Publisher: The Royal Society
Year: 1990
Tongue: English
Weight: 106 KB
Volume: 333
Category: Article
ISSN: 0264-3952
DOI: 10.2307/76791

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