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Towards Integrated Molecular Electronic Devices: Characterization of Molecular Layer Integrity During Fabrication Processes

✍ Scribed by Amr M. Mahmoud; Adam Johan Bergren; Nikola Pekas; Richard L. McCreery


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
639 KB
Volume
21
Category
Article
ISSN
1616-301X

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