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Towards barrier height modulation in HfO2/TiN by oxygen scavenging – Dielectric defects or metal induced gap states?

✍ Scribed by Luigi Pantisano; V.V. Afanas’ev; S. Cimino; C. Adelmann; L. Goux; Y.Y. Chen; J.A. Kittl; D. Wouters; M. Jurczak


Book ID
104052983
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
601 KB
Volume
88
Category
Article
ISSN
0167-9317

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