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Toward a genetic etiology of CHARGE syndrome: I. A systematic scan for submicroscopic deletions

✍ Scribed by Lalani, Seema R. ;Stockton, David W. ;Bacino, Carlos ;Molinari, Laura M. ;Glass, Nancy L. ;Fernbach, Susan D. ;Towbin, Jeffrey A. ;Craigen, William J. ;Graham, John M. ;Hefner, Margaret A. ;Lin, Angela E. ;McBride, Kim L. ;Davenport, Sandra L. ;Belmont, John W.


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
170 KB
Volume
118A
Category
Article
ISSN
0148-7299

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