𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Toward a Definition of X-ray Crystal Quality †

✍ Scribed by Maes, Dominique; Evrard, Christine; Gavira, Jose A.; Sleutel, Mike; Van De Weerdt, Cécile; Otalora, Fermin; Garcia-Ruiz, Juan Ma; Nicolis, Grégoire; Martial, Joseph; Decanniere, Klaas

Book ID
127151137
Publisher
American Chemical Society
Year
2008
Tongue
English
Weight
764 KB
Volume
8
Category
Article
ISSN
1528-7483

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Collisional excitation x-ray lasers: Tow
Collisional excitation x-ray lasers: Toward a compact x-ray source
✍ Yoshiaki Kato; Hiroyuki Daido; Ryosuke Kodama; Kensuke Murai; Fumihiro Koike 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 385 KB

Soft x-ray amplification has been observed over the wavelengths of 14.3 nm -4.6 nm in nickel-like ions of various atoms with the atomic numbers of Z=47 (Ag) to 72 (HI). These results were obtained by irradiation of a preformed plasma with a short duration laser pulse. Observation of polarization of

Quality Assessment of Sapphire Wafers fo
Quality Assessment of Sapphire Wafers for X-Ray Crystal Optics Using White Beam Synchrotron X-Ray Topography
✍ Chen, W.M. ;McNally, P.J. ;Shvydko, Yu.V. ;Tuomi, T. ;Lerche, M. ;Danilewsky, A. 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 162 KB 👁 1 views

The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering