✦ LIBER ✦

Total Ionizing Dose Hardness Assurance Issues for High Dose Rate Environments

✍ Scribed by Schwank, J. R.; Sexton, F. W.; Shaneyfelt, M. R.; Fleetwood, D. M.

Book ID: 120527164
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 440 KB
Volume: 54
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2007.893000

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Total-dose hardness assurance issues for

Total-dose hardness assurance issues for SOI MOSFETs

✍ Fleetwood, D.M.; Tsao, S.S.; Winokur, P.S. 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 685 KB

CMOS Hardness Prediction for Low-Dose-Ra

CMOS Hardness Prediction for Low-Dose-Rate Environments

✍ Derbenwick, G. F.; Sander, H. H. 📂 Article 📅 1977 🏛 IEEE 🌐 English ⚖ 690 KB

A quality assurance tool for high-dose-r

A quality assurance tool for high-dose-rate brachytherapy

✍ Rickey, Daniel W.; Sasaki, David; Bews, Jeff 📂 Article 📅 2010 🏛 American Institute of Physics 🌐 English ⚖ 512 KB

Fluorescent screen for high-dose-rate (H

Fluorescent screen for high-dose-rate (HDR) brachytherapy quality assurance

✍ A.W. Lightstone 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 187 KB

This article describes apparatus for quickly checking the positioning and dwell times of a high-doserate (HDR) afterloader as part of daily quality assurance (QA). A groove was milled into an aluminum plate to align an HDR applicator, and fluorescent screens were placed on either side of the groove.

205 Physics and quality assurance for hi

205 Physics and quality assurance for high dose rate brachytherapy

✍ Lowell L. Anderson 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Total ionizing dose effects in high volt

Total ionizing dose effects in high voltage devices for flash memory

✍ Zhangli Liu; Zhiyuan Hu; Zhengxuan Zhang; Hua Shao; Ming Chen; Dawei Bi; Bingxu 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 580 KB