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Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces

✍ Scribed by Poksinski, Michal; Arwin, Hans

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Total Internal Reflection Sum-Frequency

✍ Williams, Christopher T.; Yang, Yong; Bain, Colin D. 📂 Article 📅 2000 🏛 American Chemical Society 🌐 English ⚖ 154 KB

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✍ Nam Cao Hoai Le; Vladimir Gubala; Ram P. Gandhiraman; Conor Coyle; Stephen Danie 📂 Article 📅 2010 🏛 Springer 🌐 English ⚖ 716 KB