Total electron yield measurements of extended x-ray absorption fine structures (EXAFS) of Ni and Fe thin foils, and adsorption of Ni on polycrystalline Fe substrates

✍ Scribed by Sham, T. K.; Carr, R. G.

• Book ID: 120213875
• Publisher: American Institute of Physics
• Year: 1985
• Tongue: English
• Weight: 1013 KB
• Volume: 83
• Category: Article
• ISSN: 0021-9606
• DOI: 10.1063/1.449623