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Torque and thermal cycling as methods of testing reliability of reflow-soldered chip-to-substrate joints : M. L. Allawadhi and A. K. Kakar. IEEE 11th Annual Proceedings Reliability Physics (1973). p. 77


Book ID
103273543
Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
221 KB
Volume
12
Category
Article
ISSN
0026-2714

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