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Topological investigation of electronic silicon nanoparticulate aggregates using ultra-small-angle X-ray scattering

✍ Scribed by E. O. Jonah, D. T. Britton, P. Beaucage, D. K. Rai, G. Beaucage, B. Magunje, J. Ilavsky, M. R. Scriba, M. Härting


Book ID
118806753
Publisher
Springer Netherlands
Year
2012
Tongue
English
Weight
642 KB
Volume
14
Category
Article
ISSN
1388-0764

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