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Topological defects, pattern evolution, and hysteresis in thin magnetic films

✍ Scribed by Prudkovskii, P. A; Rubtsov, A. N; Katsnelson, M. I

Book ID
111897788
Publisher
EDP Sciences
Year
2006
Tongue
English
Weight
215 KB
Volume
73
Category
Article
ISSN
0295-5075

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