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Topography of defects at atomic resolution using scanning tunneling microscopy

✍ Scribed by H.W.M. Salemink; Inder P. Batra; H. Rohrer; E. Stoll; E. Weibel

Publisher: Elsevier Science
Year: 1987
Weight: 46 KB
Volume: 181
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(87)90717-1

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