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Topographical characterization of Ar-bombarded Si(1 1 1) surfaces by atomic force microscopy

✍ Scribed by D Niebieskikwiat; E.E Kaul; G.R Pregliasco; J.E Gayone; O Grizzi; E.A Sánchez


Book ID
114165918
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
501 KB
Volume
193
Category
Article
ISSN
0168-583X

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