Topographic Analysis of Grain Boundary Dislocations in Cold-Worked Tungsten Using Field Ion Microscopy

✍ Scribed by Eaton, H. C. ;Chou, A. C. ;Carter, J. C.

• Publisher: John Wiley and Sons
• Year: 1982
• Tongue: English
• Weight: 710 KB
• Volume: 72
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210720247