[Topics in Applied Physics] Rare Earth Oxide Thin Films Volume 106 || Local Atomic Environment of High-κ Oxides on Silicon Probed by X-Ray Absorption Spectroscopy

✍ Scribed by Fanciulli, Marco; Scarel, Giovanna

• Book ID: 121455015
• Publisher: Springer Berlin Heidelberg
• Year: 2006
• Weight: 558 KB
• Category: Article
• ISBN: 3540357963
• DOI: 10.1007/11499893_10