✦ LIBER ✦
Top down I.C. failure analysis using an E-beam system coupled to a functional tester
✍ Scribed by R. Velazco; D. Conard; A. Guyot; H. Ziade
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 738 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0167-9317
No coin nor oath required. For personal study only.