✦ LIBER ✦

Tools for high-spatial and temporal-resolution analysis of environmental responses in plants

✍ Scribed by Choon W. Wee; José R. Dinneny

Publisher: Springer Netherlands
Year: 2010
Tongue: English
Weight: 296 KB
Volume: 32
Category: Article
ISSN: 0141-5492
DOI: 10.1007/s10529-010-0307-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

High-resolution spatial and temporal ana

High-resolution spatial and temporal analysis of phytoalexin production in oats

✍ Yoshihiro Izumi; Shin’ichiro Kajiyama; Ryosuke Nakamura; Atsushi Ishihara; Atsus 📂 Article 📅 2009 🏛 Springer-Verlag 🌐 English ⚖ 725 KB

HIGH SPATIAL AND TEMPORAL RESOLUTION OPT

HIGH SPATIAL AND TEMPORAL RESOLUTION OPTICAL SEARCH FOR EVIDENCE OF METEOROID FRAGMENTATION

✍ R. L. Hawkes; P. G. Brown; N. R. Kaiser; A. J. Faloon; K. A. Hill; L. A. Rogers 📂 Article 📅 2005 🏛 Springer Netherlands 🌐 English ⚖ 221 KB

Multimodal Integration of fMRI and EEG D

Multimodal Integration of fMRI and EEG Data for High Spatial and Temporal Resolution Analysis of Brain Networks

✍ D. Mantini; L. Marzetti; M. Corbetta; G. L. Romani; C. Del Gratta 📂 Article 📅 2010 🏛 Springer 🌐 English ⚖ 996 KB

Comparison of high spatial resolution in

Comparison of high spatial resolution in EDX and EELS analysis

✍ J.M. Titchmarsh 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 335 KB

Temporal and spatial resolution of scatt

Temporal and spatial resolution of scattered and recoiled atoms for surface elemental and structural analysis

✍ Rabalais, J. W. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 458 KB 👁 1 views

Developments in low-energy ion scattering over the past 10 years have led to new techniques for surface elemental and structural analyses. The fundamental physics involved in these new methods is summarized herein and some examples of the applications of the techniques are presented. Three major new

In-Situ strain analysis with high spatia

In-Situ strain analysis with high spatial resolution: A new failure inspection tool for integrated circuit applications

✍ T. Nshanian; R. Dove; Krishna Rajan 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 263 KB

A new non-destructive technique to measure strain over small areas of specimens in the scanning electron microscope (SEM) is described. By integrating new advances in secondary electron detection, imaging of insulating oxide layers and a methodology of generating an optical moir6 fringe effect in th