Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations
✍ Scribed by D.V. Rao; T. Yuasa; T. Akatsuka; G. Tromba; M. Zahid Hasan; T. Takeda
- Book ID
- 103860342
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 162 KB
- Volume
- 239
- Category
- Article
- ISSN
- 0168-583X
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✦ Synopsis
Tomographic imaging based on scattered radiation from polyethylene (C 5 H 8 O 2 ), is evaluated, using 10, 15, 20, 25 and 30 keV synchrotron X-rays. The SYRMEP facility at Elettra, Trieste, Italy, has been used to detect the scattered radiation from the sample at an angle of 90°using Si-Pin detector coupled to a multi-channel analyzer. The contribution of transmitted, Compton and fluorescence photons are assessed from a test phantom of small dimensions with simple approximations. The optimum analysis is performed with the use of the dimensions of the sample by detecting the radiation at various energies.