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Tolerancing of diffraction-limited Kirkpatrick–Baez synchrotron beamline optics for extreme-ultraviolet metrology

✍ Scribed by Naulleau, Patrick P. ;Goldberg, Kenneth A. ;Batson, Phillip J. ;Jeong, Seongtae ;Underwood, James H.


Book ID
115349443
Publisher
The Optical Society
Year
2001
Tongue
English
Weight
285 KB
Volume
40
Category
Article
ISSN
1559-128X

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