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ToF-SIMS nitrogen profiles in oxynitride thin films: correlation with XPS bonding configurations

✍ Scribed by E. Ravizza; S. Spadoni; S. Grasso; M. E. Vitali; C. De Marco; G. Ghidini


Book ID
115562054
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
162 KB
Volume
45
Category
Article
ISSN
0142-2421

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