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ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

✍ Scribed by L. Kailas; J.-N. Audinot; H.-N. Migeon; P. Bertrand


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
446 KB
Volume
231-232
Category
Article
ISSN
0169-4332

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