✦ LIBER ✦
TOF-SIMS 5 instrument sensitivity to matrix elements in GeSi Layers: Analysis based on recording of complex secondary ions
✍ Scribed by M. N. Drozdov; Yu. N. Drozdov; D. N. Lobanov; A. V. Novikov; D. V. Yurasov
- Book ID
- 110203426
- Publisher
- Pleiades Publishing
- Year
- 2011
- Tongue
- English
- Weight
- 154 KB
- Volume
- 5
- Category
- Article
- ISSN
- 1027-4510
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