✦ LIBER ✦
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology
✍ Scribed by Roel De Mondt; Luc Van Vaeck; Andreas Heile; Heinrich F. Arlinghaus; Frank Vangaever; Jens Lenaerts
- Book ID
- 105892233
- Publisher
- Springer
- Year
- 2009
- Tongue
- English
- Weight
- 487 KB
- Volume
- 393
- Category
- Article
- ISSN
- 1618-2650
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