To test or not to test—what is it worth? : N. Lewis. Microelectron. & Reliab. 11 (1972), p. 505

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 192 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90474-5