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Tip–sample distance control for near-field scanning microwave microscopes

✍ Scribed by Kim, Myung Sik; Kim, Songhui; Kim, Jooyoung; Lee, Kiejin; Friedman, Barry; Kim, Jin-Tae; Lee, Jaekwang


Book ID
111900332
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
387 KB
Volume
74
Category
Article
ISSN
0034-6748

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