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Tip effects in the scanning-tunneling microscopy of semiconductor electrodes

✍ Scribed by R. Hiesgen; D. Meissner; W. Schmickler

Book ID: 117215742
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 150 KB
Volume: 479
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(01)00976-1

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