Time Resolved Ion Beam Induced Current measurements on MOS capacitors using a cyclotron microbeam

✍ Scribed by G. Vizkelethy; S. Onoda; T. Hirao; T. Ohshima; T. Kamiya

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 541 KB
• Volume: 267
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2009.03.057