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Time-of-Flight Secondary Ion Mass Spectrometry of Deuterated Linear Poly(dimethylsiloxane)

✍ Scribed by Zhang, Xiao Kang; Stuart, James O.; Clarson, Stephen J.; Sabata, Ashok; Beaucage, Greg


Book ID
127359407
Publisher
American Chemical Society
Year
1994
Tongue
English
Weight
304 KB
Volume
27
Category
Article
ISSN
0024-9297

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Time-of-flight secondary ion mass spectr
✍ Paul A. Zimmerman; David M. Hercules πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 862 KB

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to examine a series of poly(alky1 acrylate) (PAA) homopolymers containing a variety of ester groups. Reproducible spectra for the PAAs are obtained up to 3500 Da. The spectra are composed of clusters arranged in a series of repe