Time-of-flight secondary ion mass spectrometry, fluorescence microscopy and scanning electron microscopy: Combined tools for monitoring the process of patterning and layer-by-layer assembly of synthetic and biological materials

✍ Scribed by Chuanzhen Zhou; Kai Qi; Karen L. Wooley; Amy V. Walker

• Book ID: 108099840
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 875 KB
• Volume: 65
• Category: Article
• ISSN: 0927-7765
• DOI: 10.1016/j.colsurfb.2008.03.007