Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Conformational Changes in Adsorbed Protein Films
β Scribed by Xia, Nan; May, Collin J.; McArthur, Sally L.; Castner, David G.
- Book ID
- 127167662
- Publisher
- American Chemical Society
- Year
- 2002
- Tongue
- English
- Weight
- 118 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0743-7463
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## Abstract Time of flight secondary ion mass spectrometry (ToFβSIMS) is an ideal technique for the analysis of adsorbed protein films because of its surface sensitivity and chemical specificity. In this study, we examined ToFβSIMS with the multivariate calibration method partial least squares regr
## Abstract The characterization of adsorbed protein films with ultrahigh vacuum (UHV) surface analysis techniques requires dehydration of the samples, which can cause significant alterations in protein structure. It is desirable to preserve the structure of adsorbed protein films during drying, so